Browsing Articles by Subject "VLSI testing"

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  • Linear-testable and C-testable Nx~x Ny~ modified Booth multipliers 

    Gizopoulos, Dimitris; Paschalis, A.; Nikolos, D. (Institution of Engineering and Technology (IET), 1996)
    The testability of modified Booth multipliers is examined with respect to the cell fault model, an implementation-independent fault model. This is especially useful in design environments where the cell realisations are ...