Exhaustive and Pseudoexhaustive Built-In Two-Pattern Generation for Datapaths

Voyiatzis, Ioannis ; Paschalis, A. ; Nikolos, D. ; Halatsis, Constantin (1998)

Working Paper

In this paper a novel Carry-rotate Accumulator-based Two-pattern (CAT) Test Generator is introduced that utilizes arithmetic modules existing in datapaths in order to generate exhaustive and pseudo-exchaustive two-patterns tests. Using the CAT Test Generator in BIST datapath architectures arithmetic pseudo-exhaustive two-pattern testing is achieved for first time.

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