An Efficient Built-In Self Test Method for Robust Path Delay Fault Testing

Voyiatzis, Ioannis ; Paschalis, Antonis ; Nikolos, Dimitris ; Halatsis, Constantin (1996)

Article

Single Input Change (SIC) testing has been proposed for robust path delay fault testing. In this letter a new Built-In Self Test (BIST) method for SIC vector generation is presented. The proposed method compares favourably to the previously proposed methods for SIC pattern generation with respect to hardware overhead and time required for completion of the test.

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c 1996 Kluwer Academic Publishers. Manufactured in The Netherlands.
Except where otherwise noted, this item's license is described as c 1996 Kluwer Academic Publishers. Manufactured in The Netherlands.